2017, Volume 18, Issue 10
Frontiers of Information Technology & Electronic Engineering >> 2017, Volume 18, Issue 10 doi: 10.1631/FITEE.15e0483
Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
Affiliation(s): University of Chinese Academy of Sciences, Beijing 100049, China; Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; less
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Abstract
Keywords
LED lamp ; Accelerated aging test ; Medium lifetime ; Moving average error
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