Frontiers of Information Technology & Electronic Engineering
>> 2018,
Volume 19,
Issue 2
doi:
10.1631/FITEE.1601477
Orginal Article
Versionized process based on non-volatile random-access memory for fine-grained fault tolerance
Science and Technology on Parallel and Distributed Processing Laboratory, College of Computer, National University of Defense Technology, Changsha 410073, China.
Available online: 2018-04-23
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Abstract
Non-volatile random-access memory (NVRAM) technology is maturing rapidly and its byte-persistence feature allows the design of new and efficient fault tolerance mechanisms. In this paper we propose the versionized process (VerP), a new process model based on NVRAM that is natively non-volatile and fault tolerant. We introduce an intermediate software layer that allows us to run a process directly on NVRAM and to put all the process states into NVRAM, and then propose a mechanism to versionize all the process data. Each piece of the process data is given a special version number, which increases with the modification of that piece of data. The version number can effectively help us trace the modification of any data and recover it to a consistent state after a system crash. Compared with traditional checkpoint methods, our work can achieve fine-grained fault tolerance at very little cost.
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