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Frontiers of Information Technology & Electronic Engineering >> 2022, Volume 23, Issue 7 doi: 10.1631/FITEE.2100255
Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory
Affiliation(s): Department of Electronics and Communication Engineering, Seacom Engineering College, Howrah, West Bengal 711302, India; Department of Computer Science and Technology, Indian Institute of Engineering Science and Technology, Howrah, West Bengal 711103, India; Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal 713209, India; less
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Keywords
Resistive memory ; Cell reliability ; Stuck-at fault diagnosis ; Single-length-cycle single-attractor cellular automata ; Single-length-cycle two-attractor cellular automata ; Single-length-cycle multiple-attractor cellular automata
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