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Journal Article 6

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2019 1

2016 1

2004 1

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scanning probe microscope 2

Imaging 1

Optical microscope 1

Super-resolution 1

anoxic sludge 1

auto-feeding 1

auto-focusing 1

curing period 1

deep convolutional neural network 1

digital image 1

electron microscope 1

filamentous bacteria 1

focused ion beam-electron beam (dual beam) equipment 1

granulation 1

image mosaicking 1

imaging 1

instrumentation 1

microscope 1

nano-machining 1

nano-measurement 1

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Large Scale Scanning Probe Microscope

Lu Xiaobo,Lu Zuhong,Zhou Qing,Wang Guozhu

Strategic Study of Chinese Academy of Engineering 2004, Volume 6, Issue 9, Pages 50-55

Abstract:

This paper introduces a type of large scale scanning probe microscope, which adopts the scheme ofThe instrument achieves the auto-feeding of the probe, the auto-focusing of the optical microscope and

Keywords： scanning probe microscope auto-feeding auto-focusing image mosaicking

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Nano-measuring Instruments and Nano-machining Technology

Yao Junen

Strategic Study of Chinese Academy of Engineering 2003, Volume 5, Issue 1, Pages 33-37

Abstract: Conventional electron microscope is a major nano-measuring instrument.Newly developed scanning probe microscope and focused ion beam-electron beam (dual beam) equipment areBeijing Scientific Instrument R & D Center (KYKY) developed the first domestic scanning electron microscopeThe first domestic scanning tunneling microscope (STM) was completed in 1987 in Beijing Open LaboratoryThe Chinese electron microscope and scanning probe microscope production should be improved and enlarged

Keywords： nanotechnology nano-measurement nano-machining electron microscope scanning probe microscope focused

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Super-resolution optical microscope: principle, instrumentation, and application Special Feature on Precision Measurement and Inst

Bao-kai WANG, Martina BARBIERO, Qi-ming ZHANG, Min GU

Frontiers of Information Technology & Electronic Engineering 2019, Volume 20, Issue 5, Pages 608-630 doi: 10.1631/FITEE.1800449

Abstract:

Over the past two decades, several fluorescence- and non-fluorescence-based optical microscopes have been developed to break the diffraction limited barrier. In this review, the basic principles implemented in microscopy for super-resolution are described. Furthermore, achievements and instrumentation for super-resolution are presented. In addition to imaging, other applications that use super-resolution optical microscopes are discussed.

Keywords： Super-resolution Imaging Optical microscope

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Assessing compressive strengths of mortar and concrete from digital images by machine learning techniques

Frontiers of Structural and Civil Engineering Pages 347-358 doi: 10.1007/s11709-022-0819-z

Abstract: were cut, and several images of the cut surfaces were captured at various zoom levels using a digital microscope

Keywords： support vector machine deep convolutional neural network microscope digital image curing period

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Structure and formation of anoxic granular sludge —A string-bag hypothesis

Binbin WANG,Dangcong PENG,Xinyan ZHANG,Xiaochang WANG

Frontiers of Environmental Science & Engineering 2016, Volume 10, Issue 2, Pages 311-318 doi: 10.1007/s11783-014-0748-8

Abstract: surface morphology and internal structure of anoxic granular sludge was conducted using scanning electron microscope

Keywords： granulation sequencing batch reactor anoxic sludge scanning electron microscope filamentous bacteria

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Super-resolution Near-field Optical Imaging and its Industrial Development

Wu Shifa

Strategic Study of Chinese Academy of Engineering 2000, Volume 2, Issue 2, Pages 10-14

Abstract:

The super-resolution near-field optical imaging is an advanced project in the front of high engi-neering science and is an industry that should be developed early in the 21th century in China. In this paper, the historical events and PSTM developments in China are introduced. The imaging expressions of all kinds of the super-resolution near-field optical imaging systems are derived and compared with each others. In general, only with the mode of constant separation of tip-sample may obtain the pure optical image of sample, such as the image of refractive index, reflectivity or transmisivity of sample. The evanescent wave emitted from sample surface and the probe tip smaller than the diffraction limit are the two basic conditions of super-resolution in optical imaging. The other key to obtain the super-resolution is the modulated tip with vertical vibration in the mixture field of evanescent wave and propagating wave in near-field. For the transparent sample PSTM is the best to separate the pure optical image and topography of sampe. The author has applied for two invented patents on PSTM, which will be benificial to the development of PSTM industry in China.

Keywords： super-resolution near-field optics imaging surper resolution optical microscope