Search | Engineering

Subscribe Submit

Home Journals Focus Achievement Fronts About Us 中文版

Resource Type

Journal Article 3

Year

2022 1

2020 1

2006 1

Keywords

Attractor 1

Cascading aggregation 1

Cell reliability 1

Large-scale Boolean network 1

One-bit perturbation 1

Resistive memory 1

Single-length-cycle multiple-attractor cellular automata 1

Single-length-cycle single-attractor cellular automata 1

Single-length-cycle two-attractor cellular automata 1

Stuck-at fault diagnosis 1

monitering with earth satellite remote sensing 1

the hinterland of the Qinghai-Xizang (Tibet) Plateau region 1

the stochastic process random of the lake's natural evolvement 1

the system's dissipative structure and the attractor's fractal 1

open ︾

Search scope:

排序： Display mode:

Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory Research Article

Sutapa SARKAR, Biplab Kumar SIKDAR, Mousumi SAHA

Frontiers of Information Technology & Electronic Engineering 2022, Volume 23, Issue 7, Pages 1110-1126 doi: 10.1631/FITEE.2100255

Abstract: This paper presents a group-based dynamic scheme intended for resistive random-access memory (ReRAM). Traditional static random-access memory, dynamic random-access memory, NAND, and NOR flash memory are limited by their scalability, power, package density, and so forth. Next-generation memory types like ReRAMs are considered to have various advantages such as high package density, non-volatility, scalability, and low power consumption, but has been a problem. Unreliable memory operation is caused by permanent stuck-at faults due to extensive use of write- or memory-intensive workloads. An increased number of stuck-at faults also prematurely limit chip lifetime. Therefore, a cellular automaton (CA) based dynamic stuck-at fault-tolerant design is proposed here to combat unreliable cell functioning and variable cell lifetime issues. A scalable, block-level fault diagnosis and recovery scheme is introduced to ensure readable data despite multi-bit stuck-at faults. The scheme is a novel approach because its goal is to remove all the restrictions on the number and nature of stuck-at faults in general fault conditions. The proposed scheme is based on Wolfram's null boundary and periodic boundary CA theory. Various special classes of CAs are introduced for 100% fault tolerance: (SACAs), (TACAs), and (MACAs). The target micro-architectural unit is designed with optimal space overhead.

Keywords： Resistive memory Cell reliability Stuck-at fault diagnosis Single-length-cycle single-attractor cellularautomata Single-length-cycle two-attractor cellular automata Single-length-cycle multiple-attractor

HTML PDF Collect

Optimal one-bit perturbation in Boolean networks based on cascading aggregation Research Articles

Jin-feng PAN, Min MENG

Frontiers of Information Technology & Electronic Engineering 2020, Volume 21, Issue 2, Pages 294-303 doi: 10.1631/FITEE.1900411

Abstract: We investigate the problem of finding optimal one-bit perturbation that maximizes the size of the basin of attractions (BOAs) of desired attractors and minimizes the size of the BOAs of undesired attractors for large-scale Boolean networks by cascading aggregation. First, via the aggregation, a necessary and sufficient condition is given to ensure the invariance of desired attractors after one-bit perturbation. Second, an algorithm is proposed to identify whether the one-bit perturbation will cause the emergence of new attractors or not. Next, the change of the size of BOAs after one-bit perturbation is provided in an algorithm. Finally, the efficiency of the proposed method is verified by a T-cell receptor network.

Keywords： Large-scale Boolean network Attractor Cascading aggregation One-bit perturbation