Improvement in Resolution of Multiphoton Scanning Structured Illumination Microscopy via Harmonics

Lei Wang; Xiaomin Zheng; Jie Zhou; Meiting Wang; Jiajie Chen; Youjun Zeng; Gaixia Xu; Ying Wang; Haixia Qiu; Yonghong Shao; Junle Qu; Bruce Zhi Gao; Ying Gu

doi:10.1016/j.eng.2021.12.010

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Engineering ›› 2022, Vol. 16 ›› Issue (9) : 65-72. DOI: 10.1016/j.eng.2021.12.010

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Improvement in Resolution of Multiphoton Scanning Structured Illumination Microscopy via Harmonics

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Abstract

We describe a multiphoton (mP)-structured illumination microscopy (SIM) technique, which demonstrates substantial improvement in image resolution compared with linear SIM due to the nonlinear response of fluorescence. This nonlinear response is caused by the effect of nonsinusoidal structured illumination created by scanning a sinusoidally modulated illumination to excite an mP fluorescence signal. The harmonics of the structured fluorescence illumination are utilised to improve resolution. We present an mP-SIM theory for reconstructing the super-resolution image of the system. Theoretically, the resolution of our mP-SIM is unlimited if all the high-order harmonics of the nonlinear response of fluorescence are considered. Experimentally, we demonstrate an 86-nm lateral resolution for 2P-SIM and a 72-nm lateral resolution for second-harmonic-generation (SHG)-SIM. We further demonstrate their application by imaging cells stained with F-actin and collagen fibres in mouse-tail tendon. Our method can be directly used in commercial mP microscopes and requires no specific fluorophores or high-intensity laser.

Keywords

Super-resolution microscopy / Structured illumination microscopy / Multiphoton structured illumination microscopy / SIM

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Lei Wang, Xiaomin Zheng, Jie Zhou, Meiting Wang, Jiajie Chen, Youjun Zeng, Gaixia Xu, Ying Wang, Haixia Qiu, Yonghong Shao, Junle Qu, Bruce Zhi Gao, Ying Gu. Improvement in Resolution of Multiphoton Scanning Structured Illumination Microscopy via Harmonics. Engineering, 2022, 16(9): 65‒72 https://doi.org/10.1016/j.eng.2021.12.010

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