我国高端磁控溅射靶材应用现状及发展方向
Current Application Status and Development Direction of High-end Magnetron Sputtering Target in China
高端磁控溅射靶材(简称溅射靶材)是制备集成电路、平板显示用关键功能薄膜的核心基础材料,我国在此领域对外依存度较高,长期面临基础研究薄弱、高纯材料制备技术滞后、核心装备依赖进口等结构性挑战。本文系统梳理了半导体芯片、平板显示两类主要领域中高端磁控溅射靶材的应用现状,辨识了原材料及溅射靶材的微观成分与组织均一性、溅射靶材制备与检测装备、智能制造转型等方面的共性问题,提出了开展超高纯溅射靶材成分与组织的微观均质化研究、产业链合力攻关溅射靶材加工和检测关键设备、以数智融合驱动溅射靶材研发范式变革、聚焦前沿布局关键领域溅射靶材等产业重点发展方向。着力在攻关高纯度材料提纯与加工技术、深化“产学研用”协同创新机制、完善产业链与标准体系、兼顾人才自主培养与精准引进、重塑溅射靶材产业创新生态等方面采取务实行动,推动我国溅射靶材产业从“设备引进 ‒ 工艺模仿”的跟随发展模式向“数据驱动 ‒ 标准引领”的创新范式跃迁,保障集成电路、平板显示等战略性新兴产业的发展需求。
High-end magnetron sputtering targets serve as the core foundational materials for fabricating critical functional films used in integrated circuits and flat panel displays. China currently faces a high external dependency in this field, along with persistent structural challenges such as weak fundamental research, lagging high-purity material preparation technologies, and reliance on imported core equipment. This study reviews the application status of high-end magnetron sputtering targets in two major fields—semiconductor chips and flat panel displays, and identifies common issues including micro-composition and structural homogeneity of raw materials and targets, preparation and testing equipment for sputtering targets, and the transition to smart manufacturing. It proposes key development directions for the sputtering target industry, such as research on micro-homogenization of composition and structure of ultra-high purity targets, collaborative efforts across the industrial chain to tackle key equipment for target processing and testing, driving research paradigm transformation through digital‒intelligent integration, and focusing on forward-looking layouts of critical fields. Practical actions can be taken in areas including developing high-purity material purification and processing technologies, deepening industry‒university‒research‒application collaborative innovation mechanisms, improving the industrial chain and standards systems, balancing independent talent cultivation with targeted recruitment, and reshaping the innovation ecosystem of the sputtering target industry. These measures will help transition China's sputtering target industry from a follower model featuring "equipment introduction‒process imitation" to an innovative "data-driven‒standard-led" paradigm, thereby supporting the development needs of strategic emerging industries such as integrated circuits and flat panel displays.
溅射靶材 / 高纯材料 / 集成电路 / 平板显示 / 微观均质化
sputtering target / high-purity materials / integrated circuit / flat panel display / microscopic homogenization
| [1] |
侯洁娜, 陈颖, 赵聪鹏, 溅射靶材在集成电路领域的应用及市场情况 [J]. 中国集成电路, 2023, 32(7): 23‒28. |
| [2] |
Hou J N, Chen Y, Zhao C P, et al. Application and market of sputtering targets in integrated circuit field [J]. China Integrated Circuit, 2023, 32(7): 23‒28. |
| [3] |
何金江, 吕保国, 贾倩, 集成电路用高纯金属溅射靶材发展研究 [J]. 中国工程科学, 2023, 25(1): 79‒87. |
| [4] |
He J J, Lyu B G, Jia Q, et al. Development of high-purity metal sputtering targets for integrated circuits [J]. Strategic Study of CAE, 2023, 25(1): 79‒87. |
| [5] |
刘文迪. 集成电路用钨溅射靶材制备技术的研究进展 [J]. 中国钨业, 2020, 35(1): 36‒41. |
| [6] |
Liu W D. Research progress of preparation technology of tungsten sputtering targets for integrated circuits [J]. China Tungsten Industry, 2020, 35(1): 36‒41. |
| [7] |
郭雨. 高纯铜锰合金溅射靶材用板材退火过程中微观组织和织构演变 [D]. 重庆: 重庆大学(硕士学位论文), 2016. |
| [8] |
Guo Y. The evolution of microstructure and texture of high purity copper-manganese alloy sputter target during recrystallization [D]. Chongqing: Chongqing University (Master's thesis), 2016. |
| [9] |
Li J, An Q R, Fang H S. Monte Carlo simulation of deposition uniformity in the triple-target magnetron co-sputtering system [J]. Applied Surface Science, 2024, 646: 158914. |
| [10] |
何金江, 贺昕, 熊晓东, 集成电路用高纯金属材料及高性能溅射靶材制备研究进展 [J]. 新材料产业, 2015 (9): 47‒52. |
| [11] |
He J J, He X, Xiong X D, et al. Research progress in preparation of high purity metal materials and high performance sputtering targets for integrated circuits [J]. Advanced Materials Industry, 2015 (9): 47‒52. |
| [12] |
Kim J S, Kim J, Yang D J, et al. Addressing interconnect challenges for enhanced computing performance [J]. Science, 2024, 386(6727): 6189. |
| [13] |
Moon J H, Jeong E, Kim S, et al. Materials quest for advanced interconnect metallization in integrated circuits [J]. Advanced Science, 2023, 10(23): 2207321. |
| [14] |
祝佳林, 刘施峰, 曹宇, 交叉轧制周期对高纯Ta板变形及再结晶梯度的影响 [J]. 金属学报, 2019, 55(8): 1019‒1033. |
| [15] |
Zhu J L, Liu S F, Cao Y, et al. Effect of cross rolling cycle on the deformed and recrystallized gradient in high-purity tantalum plate [J]. Acta Metallurgica Sinica, 2019, 55(8): 1019‒1033. |
| [16] |
祝佳林, 邓超, 柳亚辉, 预退火对纯钽再结晶行为的影响 [J]. 电子显微学报, 2018, 37(6): 607‒614. |
| [17] |
Zhu J L, Deng C, Liu Y H, et al. The effect of pre-annealing on recrystallization behavior of purity tantalum [J]. Journal of Chinese Electron Microscopy Society, 2018, 37(6): 607‒614. |
| [18] |
周友平, 姚力军, 廖培君, 轧制钽靶材与粉末冶金钽靶材晶粒晶向对比 [J]. 冶金与材料, 2024, 44(3): 46‒48. |
| [19] |
Zhou Y P, Yao L J, Liao P J, et al. Comparison of grain orientation between rolled tantalum target and powder metallurgy tantalum target [J]. Metallurgy and Materials, 2024, 44(3): 46‒48. |
| [20] |
郑金凤, 扈百直, 杨国启, 高纯钽溅射靶材制备工艺进展 [J]. 湖南有色金属, 2016, 32(4): 54‒56, 80. |
| [21] |
Zheng J F, Hu B Z, Yang G Q, et al. Fabrication technology progress of high purity tantalum sputtering target [J]. Hunan Nonferrous Metals, 2016, 32(4): 54‒56, 80. |
| [22] |
Ghate P B. Aluminum alloy metallization for integrated circuits [J]. Thin Solid Films, 1981, 83(2): 195‒205. |
| [23] |
张墅野, 初远帆, 李振锋, "后摩尔时代"芯片互连方法简析 [J]. 材料导报, 2023, 37(15): 121‒130. |
| [24] |
Zhang S Y, Chu Y F, Li Z F, et al. A brief introduction of the 'more than Moore era' chip interconnection method [J]. Materials Reports, 2023, 37(15): 121‒130. |
| [25] |
张思勉, 邓晓楠, 王宇祺, 后摩尔时代芯片互连新材料及工艺革新 [J]. 中国科学: 化学, 2023, 53(10): 2027‒2067. |
| [26] |
Zhang S M, Deng X N, Wang Y Q, et al. Revolution of next-generation interconnect materials and keyprocesses for advanced chips in post-Moore era [J]. Scientia Sinica Chimica, 2023, 53(10): 2027‒2067. |
| [27] |
杨超, 曾墩风, 张信征, 高纯铜溅射靶材的发展现状 [J]. 中国金属通报, 2024 (17): 1‒3. |
| [28] |
Yang C, Zeng D F, Zhang X Z, et al. The current development status of high-purity copper sputtering targets [J]. China Metal Bulletin, 2024 (17): 1‒3. |
| [29] |
董亭义, 万小勇, 章程, 磁控溅射钛靶材的发展概述 [J]. 金属功能材料, 2017, 24(5): 57‒62. |
| [30] |
Dong T Y, Wan X Y, Zhang C, et al. The present status and development trend of magnetron sputtering Ti target [J]. Metallic Functional Materials, 2017, 24(5): 57‒62. |
| [31] |
张卫刚, 李媛媛, 孙旭东, 半导体芯片行业用金属溅射靶材市场分析 [J]. 世界有色金属, 2018 (10): 1‒3. |
| [32] |
Zhang W G, Li Y Y, Sun X D, et al. Market analysis of metal sputtering target materials used in semiconductor chip industry [J]. World Nonferrous Metals, 2018 (10): 1‒3. |
| [33] |
李剑, 王广达, 熊宁, 半导体用难熔金属靶材研究现状与展望 [J]. 粉末冶金技术, 2025, 43(5): 593‒600. |
| [34] |
Li J, Wang G D, Xiong N, et al. Current status and prospects of refractory metal targets for semiconductors [J]. Powder Metallurgy Technology, 2025, 43(5): 593‒600. |
| [35] |
刘宁, 杨辉, 姚力军, 集成电路用大尺寸高纯钽靶材的制备工艺进展 [J]. 集成电路应用, 2018, 35(2): 24‒28. |
| [36] |
Liu N, Yang H, Yao L J, et al. The progresses on fabrication of large size high-purity tantalum targets for integrated circuits [J]. Application of IC, 2018, 35(2): 24‒28. |
| [37] |
李仲香, 杨国启, 陈学清, 溅射钽靶材用高纯钽粉工艺研究 [J]. 材料开发与应用, 2017, 32(3): 67‒72. |
| [38] |
Li Z X, Yang G Q, Chen X Q, et al. Study on production process of high pure tantalum powder for tantalum target [J]. Development and Application of Materials, 2017, 32(3): 67‒72. |
| [39] |
韩思聪, 徐国进, 罗俊锋, 集成电路用高纯镍铂靶材的制备及发展趋势 [J]. 功能材料与器件学报, 2022, 28(6): 499‒503. |
| [40] |
Han S C, Xu G J, Luo J F, et al. Preparation and development trend of high purity nickel-platinum targets for integrated circuits [J]. Journal of Functional Materials and Devices, 2022, 28(6): 499‒503. |
| [41] |
徐国进, 韩思聪, 朱孜毅, 热处理制度对高纯钴微观组织及磁性能的影响 [J]. 金属热处理, 2024, 49(4): 61‒65. |
| [42] |
Xu G J, Han S C, Zhu Z Y, et al. Influence of heat treatment on microstructure and magnetic properties of high purity cobalt [J]. Heat Treatment of Metals, 2024, 49(4): 61‒65. |
| [43] |
申璐, 邓启煌. 电子行业用高纯钨制备技术 [J]. 中国科技信息, 2019 (14): 53‒54. |
| [44] |
Shen L, Deng Q H. The preparation technology of high-purity tungsten for the electronics industry [J]. China Science and Technology Information, 2019 (14): 53‒54. |
| [45] |
Liu M, Yang J X, Wang Y D, et al. Fabrication of ultrafine-grained Cu-Mn alloy with uniform microstructure and high mechanical properties [J]. Materials Characterization, 2023, 205: 113270. |
| [46] |
Zhan J L, Wang H L, Wang H L, et al. Preparation of high-density and excellent bending strength pure tungsten target by hot oscillatory pressing sintering and its magnetron sputtering coating [J]. International Journal of Refractory Metals and Hard Materials, 2024, 123: 106773. |
| [47] |
仝连海, 钟伟攀, 李凤连. 高纯溅射靶材回收研究现状 [J]. 中国有色冶金, 2024, 53(1): 61‒67. |
| [48] |
Tong L H, Zhong W P, Li F L. Research status of recovery of high-purity sputtering targets [J]. China Nonferrous Metallurgy, 2024, 53(1): 61‒67. |
| [49] |
贾国斌, 冯寅楠, 贾英. 磁控溅射用难熔金属靶材制作、应用与发展 [J]. 金属功能材料, 2016, 23(6): 48‒52. |
| [50] |
Jia G B, Feng Y N, Jia Y. Manufacture, application and development of refractorymetal target used on magnetron sputtering [J]. Metallic Functional Materials, 2016, 23(6): 48‒52. |
| [51] |
陈艳芳, 谢敬佩, 王爱琴, 钼及钼合金溅射靶材的研究现状与发展趋势 [J]. 粉末冶金技术, 2018, 36(5): 393‒398. |
| [52] |
Chen Y F, Xie J P, Wang A Q, et al. Research status and development trend of molybdenum and molybdenum alloy sputtering target materials [J]. Powder Metallurgy Technology, 2018, 36(5): 393‒398. |
| [53] |
常天海, 孙凯. ITO薄膜的磁控溅射工艺优化研究 [J]. 真空科学与技术学报, 2009, 29(3): 324‒327. |
| [54] |
Chang T H, Sun K. Growth of indium tin oxides films by magnetron sputtering [J]. Chinese Journal of Vacuum Science and Technology, 2009, 29(3): 324‒327. |
| [55] |
姜鹤, 王东新, 王燕昌, ITO靶材的毒化机理研究现状 [J]. 湖南有色金属, 2012, 28(1): 46‒50. |
| [56] |
Jiang H, Wang D X, Wang Y C, et al. The poisoning mechanism study of ITO target [J]. Hunan Nonferrous Metals, 2012, 28(1): 46‒50. |
| [57] |
Liu S H, Chen J, Sun B S, et al. Evolution of microstructure of IGZO ceramic target during magnetron sputtering [J]. Ceramics International, 2022, 48(6): 7500‒7511. |
| [58] |
刘仁智. TFL-LCD纯钼靶材制备及溅射性能研究 [D]. 西安: 西安建筑科技大学(博士学位论文), 2014. |
| [59] |
Liu R Z. Study on production technology and sputtering properties of pure Mo target of TFT-LCD [D]. Xi'an: Xi'an University of Architecture and Technology (Doctoral dissertation), 2014. |
| [60] |
Park J, Riaz H, Kim H, et al. Advanced cover glass defect detection and classification based on multi-DNN model [J]. Manufacturing Letters, 2020, 23: 53‒61. |
| [61] |
潘亚飞, 黄蕾, 张久兴. 溅射用难熔金属靶材的制备及再制造工艺研究进展 [J]. 中国粉体技术, 2025, 31(5): 39‒52. |
| [62] |
Pan Y F, Huang L, Zhang J X. Research progress on preparation and remanufacturing of refractory metal targets for sputtering [J]. China Powder Science and Technology, 2025, 31(5): 39‒52. |
| [63] |
黄志民. 退火工艺对WTi10靶材组织及纯度的影响 [J]. 粉末冶金技术, 2021, 39(3): 274‒279. |
| [64] |
Huang Z M. Influence of annealing process on microstructure and purity of WTi10 target [J]. Powder Metallurgy Technology, 2021, 39(3): 274‒279. |
| [65] |
Bian Y J, Cha M Y, Chen L, et al. Correlation between the formation of particle defects on sputtered Cu seed layers and Cu targets [J]. Micro & Nano Letters, 2019, 14(10): 1079‒1082. |
| [66] |
Zhao X Y, Yuan J P, Zhou X, et al. Effects of grain size, dislocation density, and texture type on the etching behavior of Cu target in magnetron sputtering process [J]. Surface Topography: Metrology and Properties, 2025, 13(2): 025018. |
| [67] |
刘春轩, 梁啟文, 伍小波, 常压与热压烧结工艺对合金靶材结构与性能的影响 [J]. 材料科学, 2022 (1): 7‒24. |
| [68] |
Liu C X, Liang Q W, Wu X B, et al. Effects of atmospheric and hot pressing sintering processes on the structure and properties of alloy targets [J]. Material Sciences, 2022 (1): 7‒24. |
| [69] |
慕慧娟, 丁明磊, 彭思凡. 我国溅射靶材自主可控发展的经验及启示 [J]. 科技中国, 2023 (7): 1‒6. |
| [70] |
Mu H J, Ding M L, Peng S F. Experience and enlightenment of self-controllable development of sputtering target in China [J]. Scitech in China, 2023 (7): 1‒6. |
| [71] |
Qin S Y, Meng X, Fang Y Q, et al. Deep electrochemical purification of high arsenic-bearing copper refined electrolyte [J]. Journal of Sustainable Metallurgy, 2023, 9(1): 398‒407. |
| [72] |
Custer J O, Kalaswad M, Kothari R S, et al. Sputter-deposited Mo thin films: Characterization of grain structure and Monte Carlo simulations of sputtered atom energies and incidence angles [J]. Integrating Materials and Manufacturing Innovation, 2025, 14(1): 40‒52. |
| [73] |
Vogel D J, Babuska T F, Mings A, et al. Harnessing machine learning to predict MoS2 solid lubricant performance [J]. Tribology Letters, 2025, 73(1): 23. |
| [74] |
Xu H, Wu W C, Chen Y T, et al. Explicit relation between thin film chromatography and column chromatography conditions from statistics and machine learning [J]. Nature Communications, 2025, 16: 832. |
| [75] |
Ren D, Wang C C, Wei X L, et al. Building a quantitative composition-microstructure-property relationship of dual-phase steels via multimodal data mining [J]. Acta Materialia, 2023, 252: 118954. |
国家重点研发计划项目(2021YFB3600803)
国家重点研发计划项目(2022YFC2904902)
中国工程院咨询项目“国家关键领域用先进溅射靶材料发展战略研究”(2024 HENZDA 01)
“面向2040的关键材料产业链上游高纯原料精深加工技术发展战略研究”(2023-ZCQ-18)
中原关键金属实验室研发计划项目(GJJSCXPT202401)
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