2019, Volume 5, Issue 3
Engineering >> 2019, Volume 5, Issue 3 doi: 10.1016/j.eng.2019.01.006
Applications for Nanoscale X-Ray Imaging at High Pressure
a Department of Geological Sciences, Stanford University, Stanford, CA 94305, USA
b Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA
c Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
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Abstract
Coupling nanoscale X-ray transmission microscopy (nanoTXM) with a diamond anvil cell (DAC) has exciting potential as a powerful three-dimensional probe for non-destructive imaging at high spatial resolution of materials under extreme conditions. In this article, we discuss current developments in high-resolution X-ray imaging and its application in highpressure nanoTXM experiments in a DAC with third-generation synchrotron X-ray sources, including technical considerations for preparing successful measurements. We then present results from a number of recent in situ highpressure measurements investigating equations of state (EOS) in amorphous or poorly crystalline materials and in pressure-induced phase transitions and electronic changes. These results illustrate the potential this technique holds for
addressing a wide range of research areas, ranging from condensed matter physics and solid-state chemistry to materials science and planetary interiors. Future directions for this exciting technique and opportunities to improve its capabilities for broader application in high-pressure science are discussed.
Keywords
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References
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