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Strategic Study of CAE >> 2013, Volume 15, Issue 7

Analysis and research on extending lifespan technology of FY-3 microwave radiation imager

1. Shanghai Aerospace Electronic Technology Institute, Shanghai 201109, China;

2. Shanghai Aerospace System Engineering, Shanghai 201108, China

Received: 2013-04-22 Available online: 2013-07-04 13:24:51.000

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Abstract

Considering the characteristics of Fengyun-3(FY-3) satellite lifespan on orbit increased from 3 years to 5 years, the risk of extending lifespan was analyzed, and the reliability of scan driver system and receiver system which were critical items of microwave radiation imager was evaluated, taking corresponding measures from design and improving crafts reliability. Microwave radiation imager operates normally on orbit and provides effective reliability assurance according to these methods. Finally, the ideal of accelerated lifespan test was put forward at last.

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References

[ 1 ] 哈里斯. 滚动轴承分析:轴承技术的基本概念[M]. 国际机械工 程先进技术,译(丛). 北京:机械工业出版社,2010.

[ 2 ] NASA. JPL96-25 Reliability assurance guideline for space applications[S]. United States of America:NASA,1996.

[ 3 ] 国家标准总局. GB/T 2689.1—1981 恒定应力寿命试验和加速 寿命试验方法总则[S] . 北京:中国标准出版社,1981.

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