Content
Frontiers of Information Technology & Electronic Engineering >> 2015, Volume 16, Issue 8 doi: 10.1631/FITEE.1500102
Design of a novel RTD-based three-variable universal logic gate
1. Hangzhou Institute of Service Engineering, Hangzhou Normal University, Hangzhou 311121, China.2. College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou 310027, China
Abstract
Keywords
Resonant tunneling diode (RTD) ; Threshold logic gate ; Reed-Muller expansion ; Universal logic gate
Content