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LED lamp 2

Medium lifetime 2

Moving average error 2

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Czochralski silicon 1

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Fluorescence lifetime imaging 1

N doping 1

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Thermal degradation kinetics and lifetime estimation for polycarbonate/polymethylphenylsilsesquioxane

Jiangbo WANG, Zhong XIN

Frontiers of Chemical Science and Engineering 2009, Volume 3, Issue 2,   Pages 167-171 doi: 10.1007/s11705-009-0006-y

Abstract: Meanwhile, the addition of PMPSQ influenced the lifetime of PC, but the composite still met the demand

Keywords： polycarbonate     polymethylphenylsilsesquioxane     thermal degradation kinetics     activation energy     lifetime    

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Full lifetime cost analysis of battery, plug-in hybrid and FCEVs in China in the near future

Zhihua CAI, Xunmin OU, Qian ZHANG, Xiliang ZHANG

Frontiers in Energy 2012, Volume 6, Issue 2,   Pages 107-111 doi: 10.1007/s11708-012-0182-1

Abstract: This paper analyzes the full lifetime cost of battery electric vehicles (BEVs), plug-in hybrid electricThe full lifetime cost comprises the initial and periodic cost of owning and operating the vehicle.Compared with the conventional gasoline vehicles, the full lifetime cost of the BEVs, PHEVs and FCEVsresults also suggest that with reasonably anticipatable technological progress in the long term, the lifetime

Keywords： electric vehicle (EV)     life time cost     China    

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Novel methods by using non-vacuum insulated tubing to extend the lifetime of the tubing

Chenglong ZHOU,Guojin ZHU,Yongxiang XU,Jifei YU,Xiaoliang ZHANG,Hongzhi SHENG

Frontiers in Energy 2015, Volume 9, Issue 2,   Pages 142-147 doi: 10.1007/s11708-015-0357-7

Abstract: The analysis of the failure mechanics, namely hydrogen permeation of vacuum insulated tubing (VIT), indicated that the failure of VIT could be decreased but could not be avoided. To solve this problem, some measures by using non-vacuum materials were proposed and analyzed in this paper. The results show that to fill the tubing with foam-glass beads or high pressure argon may lead to a good performance.

Keywords： vacuum insulated tubing     cyclic steam stimulation     insulation material     thermal conductivity     foam-glass     hydrogen permeation    

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Multi-functional 3D N-doped TiO

Zijian Cui, Kaiyue Zhang, Guangyu Xing, Yaqing Feng, Shuxian Meng

Frontiers of Chemical Science and Engineering 2017, Volume 11, Issue 3,   Pages 395-404 doi: 10.1007/s11705-017-1643-1

Abstract: TMF changed the TMF microstructure, which led to a higher open circuit voltage and a longer electron lifetime

Keywords： DSSCs     N doping     scattering layer     electron lifetime    

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SiO2 passivation layer grown by liquid phase deposition for silicon solar cell application

Yanlin CHEN,Sihua ZHONG,Miao TAN,Wenzhong SHEN

Frontiers in Energy 2017, Volume 11, Issue 1,   Pages 52-59 doi: 10.1007/s11708-016-0429-3

Abstract: roles in outstanding passivation effect of the LPD SiO film through analyzing the minority carrier lifetime

Keywords： Si solar cell     passivation     SiO2     liquid phase deposition     carrier lifetime    

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Solid-state-reaction fabrication and properties of a high-doping Nd:YAG transparent laser ceramic

WU Yusong, LI Jiang, PAN Yubai, LIU Wenbin, AN Liqiong, WANG Shiwei, GUO Jingkun

Frontiers of Chemical Science and Engineering 2008, Volume 2, Issue 3,   Pages 248-252 doi: 10.1007/s11705-008-0048-6

Abstract: The main emission peak is at 1064 nm and the fluorescence lifetime is 102 ?s.

Keywords： neodymium-doped yttrium     maximum absorbed     microstructure     fluorescence lifetime     threshold    

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Statistical analysis of recombination properties of the boron-oxygen defect in p-type Czochralski silicon

Nitin NAMPALLI,Tsun Hang FUNG,Stuart WENHAM,Brett HALLAM,Malcolm ABBOTT

Frontiers in Energy 2017, Volume 11, Issue 1,   Pages 4-22 doi: 10.1007/s11708-016-0442-6

Abstract: This paper presents the application of lifetime spectroscopy to the study of carrier-induced degradationa large data set of p-type silicon samples is used to investigate two important aspects of carrier lifetimeanalysis: ① the methods used to extract the recombination lifetime associated with the defect and ②the underlying assumption that carrier injection does not affect lifetime components unrelated to theIllumination also appeared to cause a minor, apparently injection-independent change in lifetime that

Keywords： Czochralski silicon     boron-oxygen defect     injection dependent lifetime spectroscopy     goodness-of-fit     repeatability    

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Facile and Scalable Preparation of Fluorescent Carbon Dots for Multifunctional Applications Article

Dan Wang,Zhiyong Wang,Qiuqiang Zhan,Yuan Pu,Jie-Xin Wang,Neil R. Foster,Liming Dai

Engineering 2017, Volume 3, Issue 3,   Pages 402-408 doi: 10.1016/J.ENG.2017.03.014

Abstract: Owing to their low cytotoxicity and long fluorescence lifetime, these FCDs were successfully used asprobes in human cancer cell lines (HeLa cells) for two-photon excited imaging of cells by fluorescence lifetime

Keywords： Scalable     Carbon dots     Two-photon     Fluorescence lifetime imaging     Patterning    

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Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps Article

Jian HAO, Lei JING, Hong-liang KE, Yao WANG, Qun GAO, Xiao-xun WANG, Qiang SUN, Zhi-jun XU

Frontiers of Information Technology & Electronic Engineering 2017, Volume 18, Issue 10,   Pages 1678-1678 doi: 10.1631/FITEE.1500483

Abstract: 在LED灯具加速老化过程中，为获得最小截止时间，对其寿命进行快速预估，本文采用5阶滑动平均误差方法分析数据。选用同批次的16个样本，分别进行80℃和85℃应力条件下的加速老化。首先，采用e指数对光通维持率进行拟合，获得每个灯具的加速寿命，进而采用威布尔分布对加速寿命进行拟合，获得中位寿命。其次，采用平均滑动误差方法，可获取不同截止时间下中位寿命预估误差。结果表明：加速老化过程中，存在最小截止时间，该时间可通过滑动平均误差和截止时间的关系确定；当截止时间小于该值时，寿命预估不合理；寿命预估误差随截止时间增加而逐渐减小。对于该类LED灯具，80℃时最小截止时间为1104小时，寿命预估误差为1.15%；85℃时最小截止时间为936小时，寿命预估误差为1.24%。当寿命估计误差约为0.46％时，80 ℃和85 ℃对应的中位寿命分别为7310小时和4598小时。

Keywords： LED lamp     Accelerated aging test     Medium lifetime     Moving average error    

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Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu,sunq@ciomp.ac.cn

Frontiers of Information Technology & Electronic Engineering 2017, Volume 18, Issue 10,   Pages 1678-1678 doi: 10.1631/FITEE.15e0483

Abstract: Erratum to: , 2017 18(8):1197-1204. doi:

Keywords： LED lamp     Accelerated aging test     Medium lifetime     Moving average error    

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Title Author Date Type Operation

Thermal degradation kinetics and lifetime estimation for polycarbonate/polymethylphenylsilsesquioxane

Jiangbo WANG, Zhong XIN

Journal Article

Full lifetime cost analysis of battery, plug-in hybrid and FCEVs in China in the near future

Zhihua CAI, Xunmin OU, Qian ZHANG, Xiliang ZHANG

Journal Article

Novel methods by using non-vacuum insulated tubing to extend the lifetime of the tubing

Chenglong ZHOU,Guojin ZHU,Yongxiang XU,Jifei YU,Xiaoliang ZHANG,Hongzhi SHENG

Journal Article

Multi-functional 3D N-doped TiO

Zijian Cui, Kaiyue Zhang, Guangyu Xing, Yaqing Feng, Shuxian Meng

Journal Article

SiO2 passivation layer grown by liquid phase deposition for silicon solar cell application

Yanlin CHEN,Sihua ZHONG,Miao TAN,Wenzhong SHEN

Journal Article

Solid-state-reaction fabrication and properties of a high-doping Nd:YAG transparent laser ceramic

WU Yusong, LI Jiang, PAN Yubai, LIU Wenbin, AN Liqiong, WANG Shiwei, GUO Jingkun

Journal Article

Statistical analysis of recombination properties of the boron-oxygen defect in p-type Czochralski silicon

Nitin NAMPALLI,Tsun Hang FUNG,Stuart WENHAM,Brett HALLAM,Malcolm ABBOTT

Journal Article

Facile and Scalable Preparation of Fluorescent Carbon Dots for Multifunctional Applications

Dan Wang,Zhiyong Wang,Qiuqiang Zhan,Yuan Pu,Jie-Xin Wang,Neil R. Foster,Liming Dai

Journal Article

Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian HAO, Lei JING, Hong-liang KE, Yao WANG, Qun GAO, Xiao-xun WANG, Qiang SUN, Zhi-jun XU

Journal Article

Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu,sunq@ciomp.ac.cn

Journal Article